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Quantitative analysis of reflection electron energy‐loss spectra
Author(s) -
Yubero F.,
Tougaard S.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740190152
Subject(s) - electron energy loss spectroscopy , formalism (music) , reflection (computer programming) , spectral line , electron , computational physics , dielectric , spectroscopy , dielectric response , atomic physics , materials science , physics , computer science , quantum mechanics , optoelectronics , art , musical , visual arts , programming language
It is shown that a quantitative description of the energy‐loss processes in a reflection electron energy‐loss spectroscopy (REELS) experiment cannot be obtained from a simple linear combination of pure bulk and pure surface components. A quantitative description can, however, be obtained within the dielectric response formalism for a more realistic model which takes into account the physical conditions in a REELS experiment.
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