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High‐energy LMM Auger transitions
Author(s) -
Weisz S. Z.,
Gomez M.,
Resto O.,
Many A.,
Goldstein Y.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740190151
Subject(s) - auger , auger electron spectroscopy , resolution (logic) , energy (signal processing) , atomic physics , line (geometry) , yield (engineering) , chemistry , auger effect , analytical chemistry (journal) , spectroscopy , computational physics , physics , mathematics , nuclear physics , thermodynamics , geometry , quantum mechanics , chromatography , artificial intelligence , computer science
We have recently shown that with the commonly available resolution in Auger electron spectroscopy measurements, significant errors can be incurred in the measured Auger line intensities. To overcome this difficulty, a universal relation has been derived theoretically whereby the experimentally measured line intensities can easily be corrected so as to yield good estimates for the true intensities, i.e. those that would have been measured were the resolution infinitely good. The validity of our correction procedure was recently demonstrated for the high‐energy KLL and low‐energy LMM lines of Si, Al and Mg as well as for the high‐energy LMM and low‐energy MNN lines of Cu. In this paper we extend these studies to the high‐energy LMM lines of Zn, Ge, Fe, Co and Ni. We present here the intrinsic lineshapes of these lines as well as the Auger sensitivities relative to silver, measured with different resolutions. The correction procedure applied to the data yields the true sensitivities to a good approximation and is therefore important for quantification and for theoretical calculations of Auger Yields.