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An in situ XPS study of the formation of aluminium–polymer interfaces
Author(s) -
Marcus P.,
Hinnen C.,
Imbert D.,
Siffre J. M.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740190125
Subject(s) - x ray photoelectron spectroscopy , aluminium , carbon fibers , oxygen , deposition (geology) , aluminium oxide , polymer , chemical state , chemistry , analytical chemistry (journal) , polypropylene , stoichiometry , chemical composition , materials science , chemical engineering , inorganic chemistry , metallurgy , composite material , organic chemistry , paleontology , sediment , composite number , engineering , biology
Abstract XPS was used to study the initial stages of aluminium deposition on polypropylene. Aluminium was ion sputtered in the preparation chamber of the spectrometer with controlled oxygen and H 2 O partial pressures. The surface composition of the polymer before and after metallization was analysed by XPS and the core levels Al 2p, O 1s and C 1s were used to obtain information on the chemical bonds formed during the deposition of aluminium. By minimizing the principal sources of oxygen during deposition, aluminium films with low oxygen content could be obtained, allowing for investigation of the aluminium‐carbon interaction. The appearance of new peaks in the Al 2p region with a chemical shift of 1.3 ± 0.3 eV with respect to aluminium and in the C 1s region with a chemical shift of 2.6 ± 0.4 eV with respect to carbon in polypropylene indicates a chemical reaction between aluminium and carbon with a charge transfer from aluminium to carbon. The XPS peak intensities are used to estimate the stoichiometry of this interfacial compound.