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Peculiarities of the Cu LVV Auger line in copper oxide cuprates and HTSC‐materials studied by x‐ray photoelectron and Auger electron spectroscopies
Author(s) -
Akimov A. G.,
Dementjev A. P.,
Le Héricy J.,
Kazansky L. P.,
Khodan A. N.,
Langeron J. P.,
Melnikova N. A.,
Rakhovsky V. I.,
Vignes J. L.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740181003
Subject(s) - auger electron spectroscopy , auger , x ray photoelectron spectroscopy , cuprate , copper , spectral line , chemistry , oxide , analytical chemistry (journal) , superconductivity , electron , copper oxide , laser linewidth , atomic physics , materials science , condensed matter physics , nuclear magnetic resonance , physics , laser , organic chemistry , astronomy , chromatography , nuclear physics , optics , quantum mechanics
Auger electron spectroscopy investigations of various copper compounds, including oxides, cuprates and high‐temperature superconducting (HTSC) YBaCuO‐type materials, show that the linewidth of the Cu LVV transition for these compounds increases with the oxygen‐to‐copper ratio. Correspondingly, for the same compounds, the intensity ratio of the satellite ( I s ) and main ( I m ) lines in the Cu 2 p3/2 line measured from XPS spectra decreases. Taking into account the mechanisms of Auger electron and x‐ray photoelectron transitions, this correlation may be explained by an increase in the probability of electron transition from the O 2p to Cu 3d level in cuprates when compared with CuO. The peculiarities of Auger spectra found for YBa 2 Cu 3 O 6.6–6.9 and for cuprates may be used to evaluate the quality of HTSC films by Auger microprobe.