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A one‐film‐model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index
Author(s) -
Krisdhasima Viwat,
McGuire Joseph,
Sproull Robert
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740180614
Subject(s) - refractive index , ellipsometry , materials science , optics , index (typography) , yield (engineering) , software , feature (linguistics) , computer program , computer science , thin film , optoelectronics , physics , nanotechnology , composite material , linguistics , philosophy , world wide web , programming language , operating system
Heterogeneous protein films are not perfectly suited to ellipsometric analysis, and commercially available software often fails to yield meaningful optical properties for such films. Here, we describe a computer program uniquely suited for calculation of the thickness and refractive index of protein films. An important feature of the new program is an algorithm that allows a search for a solution in up to four directions.