A one‐film‐model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index | Zendy

Krisdhasima Viwat | Zendy; McGuire Joseph | Zendy; Sproull Robert | Zendy

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A one‐film‐model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index

Author(s) -

Krisdhasima Viwat,

McGuire Joseph,

Sproull Robert

Publication year - 1992

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740180614

Subject(s) - refractive index , ellipsometry , materials science , optics , index (typography) , yield (engineering) , software , feature (linguistics) , computer program , computer science , thin film , optoelectronics , physics , nanotechnology , composite material , linguistics , philosophy , world wide web , programming language , operating system

Heterogeneous protein films are not perfectly suited to ellipsometric analysis, and commercially available software often fails to yield meaningful optical properties for such films. Here, we describe a computer program uniquely suited for calculation of the thickness and refractive index of protein films. An important feature of the new program is an algorithm that allows a search for a solution in up to four directions.

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