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An XPS analysis of different SiO 2 modifications employing a C 1s as well as an Au 4f 7/2 static charge reference
Author(s) -
Gross Th.,
Ramm M.,
Sonntag H.,
Unger W.,
Weijers H. M.,
Adem E. H.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740180110
Subject(s) - x ray photoelectron spectroscopy , silanol , binding energy , analytical chemistry (journal) , quartz , charge (physics) , chemistry , materials science , atomic physics , nuclear magnetic resonance , physics , chromatography , organic chemistry , catalysis , quantum mechanics , composite material
Four different silica modifications—thermally grown SiO 2 , quartz glass, silicalite and silica gel—have been investigated by XPS. Binding energies for Si 2p, Si 2s and O 1s were obtained by employing different methods of static charge referencing. In any case, a C 1s references was used as usual. In another experiment, deposited 20 nm gold particles were used to provide an Au 4f 7/2 binding energy (BE) reference. The two different charging correction procedures result in essentially identical BE data. Furthermore, the results confirm that different modifications of silica give substantially the same relevant BEs in XPS. Though the investigated samples are characterized by quite different concentrations of silanol groups, no significant effect on the measured BEs has been found. On the other hand, the analysed silica samples are observed with quite different Si 2p and O 1s peaks widths. This effect is discussed in terms of differential charging. A rather extensive compilation of XPS literature BEs of silica modifications is given.