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X‐ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides
Author(s) -
Deroubaix G.,
Marcus P.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740180107
Subject(s) - x ray photoelectron spectroscopy , zinc , copper , auger electron spectroscopy , valence (chemistry) , chemistry , auger , alloy , analytical chemistry (journal) , electron spectroscopy , spectroscopy , inorganic chemistry , nuclear magnetic resonance , atomic physics , environmental chemistry , physics , organic chemistry , quantum mechanics , nuclear physics
Various copper and zinc compounds (Cu, Zn, CuZn alloy, Cu 2 O, CuO, Cu 2 S, ZnO, ZnS) have been synthesized and characterized by electron spectroscopy (XPS). Data on the 2 p 3/2 levels of Cu, Zn and S, the 1s level of O, the L 3 M 45 M 45 Auger transitions of Cu and Zn, the valence bands and the modified Auger parameters are reported. The results obtained with these reference compounds allow qualitative and quantitative interpretation of XPS analyses on mixtures of these compounds.