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Characterization of interfaces in ceramic composites by SIMS, AES and EPMA
Author(s) -
Mischler S.,
Bishop H. E.,
Davies J. J. R.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740180105
Subject(s) - electron microprobe , secondary ion mass spectrometry , microanalysis , composite material , materials science , ceramic , titanium , cordierite , microprobe , matrix (chemical analysis) , electron probe microanalysis , analytical chemistry (journal) , chemistry , ion , mineralogy , metallurgy , organic chemistry , chromatography
Fracture surfaces and polished cross‐sections of aligned SiC fibre–cordierite matrix composites have been studies using SIMS, AES and electron probe x‐ray microanalysis (EPMA). It has been shown that, during fabrication, interface reactions resulting in penetration of the fibres by matrix cations take place. Titanium diffusion out from the fibres together with segregation of matrix elements to the interface is also observed. A correlation is found between interface composition and mechanical properties of the composites. The relative merits of SIMS, AES and EPMA in the determination of the nature of the fibre‐matrix interface are discussed. SIMS using a microfocused Ga ion beam is shown to be a powerful new tool in the investigation of interfaces.