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American society for testing and materials. Standard guide for minimizing unwanted electron beam effects in Auger electron spectroscopy (E983‐89)
Publication year - 1991
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740171209
Subject(s) - auger electron spectroscopy , cathode ray , electron , electron spectroscopy , spectroscopy , beam (structure) , atomic physics , engineering physics , physics , nuclear physics , optics , quantum mechanics
This standard is issued under the fixed designation E983; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon (ε) indicates an editorial change since the last revision or reapproval.

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