Premium
Recent development in quantitative XPS in the USSR
Author(s) -
Nefedov V. I.
Publication year - 1991
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740171202
Subject(s) - x ray photoelectron spectroscopy , photoionization , adsorption , materials science , amorphous solid , analytical chemistry (journal) , chemistry , physics , ionization , environmental chemistry , crystallography , nuclear magnetic resonance , ion , organic chemistry
A review of the recent theoretical and practical achievements in quantitative XPS in the USSR is presented. The following items are discussed: theoretical development—determination of in‐depth profiles on the basis of angular dependences of ESCA intensities, correction for contamination layer, quantitative characterization of the supported particles, determination or calculation of some physical parameters (photoionization) cross‐section, photoelectron mean free paths, (line shapes); practical application of quantitative ESCA surface analysis—high‐temperature superconductors, oxidation of alloys and metals, fluorination of alloys and metals, amorphous alloys, catalysts, semiconductors and related systems, oxides and related systems, adsorption, films on solids.