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A new approach for curve‐resolving photoemission peaks in XPS
Author(s) -
Mattogno Giulia,
Righini Guido
Publication year - 1991
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740171002
Subject(s) - x ray photoelectron spectroscopy , spectral line , derivative (finance) , metal , analytical chemistry (journal) , photoemission spectroscopy , raw data , chemistry , function (biology) , fraction (chemistry) , computational physics , materials science , atomic physics , physics , nuclear magnetic resonance , mathematics , quantum mechanics , metallurgy , organic chemistry , statistics , chromatography , evolutionary biology , biology , financial economics , economics
A new approach for obtaining photoemission peak areas from XPS spectra at the analytical level is proposed. In standard data handling, background removal is necessary for determining the peak areas in order to obtain the atomic fraction of the elements present on outer layers. It is possible to associate an analytical function to the inelastic scattering background. This new approach uses this analytical function during curve‐fitting proicedures on the first derivative of the raw derivative of the raw spectrum. The systems studied are metallic Pd and PdO in powder form and grown over metallic palladium. The results are in good agreement with theoretical hypothesis.