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Secondary Ion Mass Spectrometry—a Practical Handbook for Depth Profiling and Bulk Impurity Analysis Wiley, New York, 1989
Author(s) -
Clegg J. B.
Publication year - 1991
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740170411
Subject(s) - profiling (computer programming) , secondary ion mass spectrometry , library science , citation , engineering physics , mass spectrometry , chemistry , analytical chemistry (journal) , computer science , physics , chromatography , operating system
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