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Peak identification for mass spectroscopy
Author(s) -
Lareau R. T.,
Buser C. H.,
Savin W.
Publication year - 1991
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740170110
Subject(s) - mass spectrometry , mass spectrum , chemistry , analytical chemistry (journal) , mass , static secondary ion mass spectrometry , ion , secondary ion mass spectrometry , range (aeronautics) , atomic mass , resolution (logic) , atomic physics , physics , chromatography , materials science , computer science , organic chemistry , artificial intelligence , composite material
Quick, accurate identification of mass spectral peaks is essential, whether the sample is in a gas, liquid or solid state. Often, the mass‐filtered ion spectra include peaks due to atomic, molecular, cluster or multiply charged species. The computer program discussed herein will provide an aid to the mass spectroscopist in identifying: (1) an unknown/interference mass peak; (2) possible overlapping (non‐resolvable) mass species; (3) the required mass resolution necessary to separate neighboring mass species. Other advantages include user selectable species, PC compatible software, unlimited mass range, and unlimited number of variables. Examples will presented for samples analyzed by secondary ion mass spectrometry (SIMS) and glow discharge mass spectrometry (GDMS), as well as indications for its use in general organic mass spectrometry.