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Surface analysis and adhesion of polypropylene after low‐pressure plasma treatment
Author(s) -
Nowak S.,
Haerri H.P.,
Schlapbach L.,
Vogt J.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740160187
Subject(s) - polypropylene , x ray photoelectron spectroscopy , polymer , adhesion , surface modification , plasma , materials science , adhesive , degradation (telecommunications) , chemical engineering , composite material , atmospheric pressure plasma , polymer chemistry , analytical chemistry (journal) , chemistry , layer (electronics) , chromatography , telecommunications , physics , quantum mechanics , computer science , engineering
We have used XPS core‐level spectroscopy to study the nature of polypropylene surfaces that were exposed to an rf‐induced low‐pressure plasma. This treatment resulted in enhanced oxidation of the polymer surface, which can be attributed to CO functionalities. This modification of the polymer surface allowed the proparation of adhesive joints with improved strength of the polymerepoxy interface. Langmuir probe techniques were used to characterize the plasma. X‐ray degradation of the plasma‐modified polymer surfaces was observed.