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An XPS study of Cs 2 Te photocathode materials
Author(s) -
Soriano L.,
Galan L.,
Rueda F.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740160138
Subject(s) - photocathode , x ray photoelectron spectroscopy , stoichiometry , auger , auger electron spectroscopy , chemistry , analytical chemistry (journal) , metal , ionic bonding , deposition (geology) , photoelectric effect , electron , materials science , ion , chemical engineering , atomic physics , physics , paleontology , optoelectronics , organic chemistry , quantum mechanics , chromatography , sediment , nuclear physics , engineering , biology
The caesiation of a clean Te metal film during the formation process of a Cs 2 Te photocathode has been studied by X‐ray photoelectron and Auger electron spectroscopies. Cs 2 Te is essentially an ionic compound that is stable with a large Cs excess. The ionicity increases with Cs content up to the stoichiometric composition. The Cs excess, which affects the photoemissive spectral response, cannot be reversed by Te deposition since very stable elemental Te clusters seem to be formed. CsTe has been found also during the formation process.