Premium
VAMAS surface chemical analysis technical working party—an overview of project objectives, progress and the requirements for further work
Author(s) -
Seah M. P.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740160126
Subject(s) - profiling (computer programming) , work (physics) , engineering management , computer science , x ray photoelectron spectroscopy , engineering , construction engineering , mechanical engineering , chemical engineering , operating system
An update for 1989 is given for the VAMAS Surface Chemical Analysis Technical Working Party. The overall programme now has 26 projects targeted to solve key problems in the enabling base of AES, XPS, SIMS, SNMS and sputter depth profiling. Increased coordination of projects is leading to stronger project databases. Eleven of the projects have involved round robins, and details are provided of results where the analysis is complete and of project leaders where new participants are invited.