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Oscillations in the optical characteristics of Ge films during MBE by automatic ellipsometry
Author(s) -
Pchelyakov O. P.,
Sokolov L. V.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740160108
Subject(s) - library science , semiconductor , engineering physics , citation , physics , ellipsometry , optoelectronics , computer science , thin film , quantum mechanics