Premium
A high energy resolution, high spatial resolution photoemission microscope
Author(s) -
Knapp G. S.,
Keenylside M.,
Griffin C.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740151212
Subject(s) - resolution (logic) , microscope , image resolution , x ray photoelectron spectroscopy , detector , optics , spectrum analyzer , photoemission spectroscopy , focus (optics) , energy (signal processing) , materials science , high resolution , electron microscope , sample (material) , spectroscopy , electron , physics , nuclear magnetic resonance , remote sensing , computer science , nuclear physics , geography , quantum mechanics , artificial intelligence , thermodynamics
This paper will discuss a microscope that allows high energy resolution spectroscopy to be performed at high spatial resolution. This instrument uses a high magnetic field to contain and focus electrons emitted from the sample surface and has a two‐dimensional detector that records a photoelectron image. It is also equipped with a hemispherical analyzer, which allows state‐of‐the‐art spectroscopic performance to be obtained from very small areas. The instrument is unique in that it collects a much larger solid angle than any other instrument in use today, and spatial resolutions of 2 μm and energy resolutions of 0.25 eV have been achieved.