A high energy resolution, high spatial resolution photoemission microscope | Zendy

Knapp G. S. | Zendy; Keenylside M. | Zendy; Griffin C. | Zendy

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A high energy resolution, high spatial resolution photoemission microscope

Author(s) -

Knapp G. S.,

Keenylside M.,

Griffin C.

Publication year - 1990

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740151212

Subject(s) - resolution (logic) , microscope , image resolution , x ray photoelectron spectroscopy , detector , optics , spectrum analyzer , photoemission spectroscopy , focus (optics) , energy (signal processing) , materials science , high resolution , electron microscope , sample (material) , spectroscopy , electron , physics , nuclear magnetic resonance , remote sensing , computer science , nuclear physics , geography , quantum mechanics , artificial intelligence , thermodynamics

This paper will discuss a microscope that allows high energy resolution spectroscopy to be performed at high spatial resolution. This instrument uses a high magnetic field to contain and focus electrons emitted from the sample surface and has a two‐dimensional detector that records a photoelectron image. It is also equipped with a hemispherical analyzer, which allows state‐of‐the‐art spectroscopic performance to be obtained from very small areas. The instrument is unique in that it collects a much larger solid angle than any other instrument in use today, and spatial resolutions of 2 μm and energy resolutions of 0.25 eV have been achieved.

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