Premium
Analysis of zirconium–niobium pressure tube surfaces for hydrogen using secondary ion mass spectrometry (SIMS)
Author(s) -
McIntyre N. S.,
Weisener C. G.,
Davidson R. D.,
Lennard W. N.,
Massoumi G. R.,
Mitchell I. V.,
Brennenstuhl A.,
Warr B.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740151004
Subject(s) - hydrogen , secondary ion mass spectrometry , niobium , sputtering , zirconium , analytical chemistry (journal) , alloy , zirconium alloy , deuterium , oxide , mass spectrometry , materials science , chemistry , metallurgy , thin film , nanotechnology , atomic physics , physics , organic chemistry , chromatography
Understanding the mechanisms of hydrogen ingress into pressure tubes fabricated from zirconium–2.5% (w/w) niobium alloy requires knowledge of the hydrogen concentration in the surface oxides, of the oxide/metal interface and in the alloy phase beneath the interface. Secondary ion mass spectrometry (SIMS) has attractive capabilities for detecting hydrogen isotopes in such surface films, but its quantitative response and spatial resolution are controversial for hydrogen because of the strong tendency for the element to migrate, owing to thermal and sputtering effects. High sputter rate conditions have been used here, which result in an improved capability to detect hydrogen in ZrNb alloy and ZrO 2 down to concentrations of <2 × 10 17 atoms cm −3 (<0.1 ppm, w/w). Quantitation of deuterium concentrations has been accomplished by SIMS calibrated using ion implants and, in some cases, verified by nuclear reaction analysis (NRA).