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XPS determination of the thickness of adsorbed mouthrinse components on dental enamel
Author(s) -
Busscher H. J.,
Van der Mei H. C.,
Genet M. J.,
Perdok J. F.,
Rouxhet P. G.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740150508
Subject(s) - x ray photoelectron spectroscopy , enamel paint , adsorption , layer (electronics) , materials science , analytical chemistry (journal) , dental enamel , spectrometer , chemistry , chemical engineering , composite material , chromatography , optics , engineering , physics
In this paper, the stationary charging voltage of human dental enamel samples due to photoelectron ejection in an x‐ray photoelectron spectrometer is related to the amount of material adsorbed from commercially available mouthrinses and the adsorbed layer thickness. A clear relationship was observed between the charging voltage versus the C/Ca elemental surface concentration ratio, taken as a measure of the amount of adsorbed material. Consequently, a similar relationship was found between charging versus adsorbed layer thickness.