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Application of fast atom bombardment (FAB) for ion microscopy of a rock sample
Author(s) -
Seyama H.,
Soma M.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740150502
Subject(s) - biotite , secondary ion mass spectrometry , analytical chemistry (journal) , ion , feldspar , chemistry , crystallization , sample preparation , mineralogy , materials science , quartz , metallurgy , organic chemistry , chromatography
A CAMECA IMS4f ion microscope was modified to accommodate a fast atom bombardment (FAB) source and used for the analysis of the thin section of a rock sample (granodiorite). In contrast to conventional SIMS using a primary ion beam, it is easy to obtain secondary ion images and mass spectra of poorly conducting material, such as geological samples, by SIMS using a FAB source where the charging effect is easily avoided with the aid of a copper grid placed on the sample surface. The difference of elemental distribution between biotite and feldspar phases in the granodiorite sample was revealed in the positive secondary ion images and mass spectra obtained by use of an O 2 FAB source. The images of 23 Na + and 39 K + ions clearly showed that the separation of potassium and sodium feldspars occurred in the process of feldspar crystallization.