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SIMS/AES characterization of the initial oxidation of an iron—chromium—molybdenum alloy and its base metals at room temperature
Author(s) -
Mathieu H. J.,
Landolt D.
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740141111
Subject(s) - molybdenum , chromium , sputtering , alloy , analytical chemistry (journal) , metal , oxide , materials science , layer (electronics) , secondary ion mass spectrometry , metallurgy , chemistry , thin film , mass spectrometry , nanotechnology , chromatography
Low‐temperature oxidation of a FeCrMo alloy and their base metals was investigated by static and dynamic positive and negative SIMS combined with AES Ar + sputter profiling at 5 keV primary beam energy. In situ oxidation was carried out for 0.3–10000 Langmuir (L) oxygen exposure after sputter cleanning. Static SIMS revealed oxidation of chromium at the outer surface at very low exposures (<0.5 L). With increasing exposures, mainly Fe 2 O 3 was formed at the surface. Dynamic SIMS and AES concentration profiles revealed a multilayer structure with an outer Fe 2 O 3 layer followed by a layer rich in chromium oxide. Oxidized molybdenum was found throughout the film and at the oxide/metal interface.