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Premium Combination of ion beam techniques, AES and SIMS for the analysis of samples exposed in the plasma boundary of the JET tokamak
Author(s)
Coad J. P.,
Simpson J. C. B.,
Neill G. F.
Publication year1989
Publication title
surface and interface analysis
Resource typeJournals
PublisherJohn Wiley & Sons Ltd.
Abstract A system combining ion beam and surface‐specific techniques for the analysis of probes exposed in the edge region of the plasma produced by the Joint European Torus (JET) is described. Among examples of the use of the system are the demonstration that 10–40% of the ionic charge flux in the boundary can be due to impurities, erosion and redeposition phenomena can be observed with small probes placed in the plasma boundary, and most of the oxygen observed on collector probes is an artefact resulting from exposure to air.
Subject(s)analytical chemistry (journal) , atomic physics , beam (structure) , chemistry , chromatography , computer science , enhanced data rates for gsm evolution , impurity , ion , ion beam , ionic bonding , jet (fluid) , joint european torus , materials science , mechanics , nuclear physics , optics , organic chemistry , physics , plasma , telecommunications , tokamak
Language(s)English
SCImago Journal Rank0.52
H-Index90
eISSN1096-9918
pISSN0142-2421
DOI10.1002/sia.740140909

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