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Combination of ion beam techniques, AES and SIMS for the analysis of samples exposed in the plasma boundary of the JET tokamak
Author(s) -
Coad J. P.,
Simpson J. C. B.,
Neill G. F.
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740140909
Subject(s) - joint european torus , tokamak , jet (fluid) , plasma , beam (structure) , ion , impurity , atomic physics , ion beam , enhanced data rates for gsm evolution , chemistry , ionic bonding , toroid , boundary (topology) , materials science , optics , nuclear physics , physics , mechanics , telecommunications , organic chemistry , computer science , mathematical analysis , mathematics
A system combining ion beam and surface‐specific techniques for the analysis of probes exposed in the edge region of the plasma produced by the Joint European Torus (JET) is described. Among examples of the use of the system are the demonstration that 10–40% of the ionic charge flux in the boundary can be due to impurities, erosion and redeposition phenomena can be observed with small probes placed in the plasma boundary, and most of the oxygen observed on collector probes is an artefact resulting from exposure to air.