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XPS studies of the fluoride ion‐selective electrode membrane LaF 3 : Ion interferences
Author(s) -
De Marco R.,
Cattrall R. W.,
Liesegang J.,
Nyberg G. L.,
Hamilton I. C.
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740140806
Subject(s) - fluoride , electrode , ion , hydroxide , inorganic chemistry , x ray photoelectron spectroscopy , chemistry , membrane , ion selective electrode , ion exchange , palladium hydrogen electrode , quinhydrone electrode , analytical chemistry (journal) , reference electrode , electrochemistry , selectivity , chemical engineering , catalysis , chromatography , organic chemistry , biochemistry , engineering
XPS has been used to investigate ion‐exchange processes occurring at the surface of the fluoride ion‐selective electrode membrane. It is shown that ion exchange occurs to a depth much greater than that of the outermost solid surface monolayer. The effect of hydroxide ion interference on the response of the electrode has been studied, and a mechanism for its action is proposed. Studies of electrode membranes exposed to carbonate and phosphate ions show that interferences on the response of the electrode cannot be interpreted by solubility product considerations alone.