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Photoelectron diffraction and surface crystallography
Author(s) -
Grenet G.,
Jugnet Y.,
Homberg S.,
Poon H. C.,
Duc Tran Minh
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740140613
Subject(s) - diffraction , x ray photoelectron spectroscopy , surface (topology) , kinetic energy , materials science , crystallography , chemistry , physics , optics , nuclear magnetic resonance , geometry , mathematics , classical mechanics
We report here the state of development of photoemission diffraction from core levels as a tool for the investigation of surfaces. Experimental procedures for performing reproducible and accurate photoemission diffraction curves are formulated. To this end, the merit and the limitations in the choice of different parameters, such as photoelectron kinetic energy or detection angles, are discussed in view of various applications. The discussion is largely exemplified from our experiences, as well as from those in the literature.