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A proposed standard (PTFE tape) for static SIMS
Author(s) -
Briggs D.
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740140407
Subject(s) - polytetrafluoroethylene , compensation (psychology) , analytical chemistry (journal) , ion , mass spectrometry , materials science , secondary ion mass spectroscopy , composite material , spectrometer , charge (physics) , chemistry , optoelectronics , optics , physics , chromatography , organic chemistry , psychology , quantum mechanics , silicon , psychoanalysis
The requirements for a viable standard material for the assessment of the performance of static secondary ion mass spectrometers are discussed. PTFE (polytetrafluoroethylene) tape appears to be a suitable candidate for assessing the absolute sensitivities of the instrument for both positively and negatively charged species, as well as assessing the charge compensation ability for insulators. An experimental procedure is described and representative spectra obtained under well‐defined conditions are presented.