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Characterization of electrodeposited metals using continuous‐wave optical second‐harmonic generation
Author(s) -
Miragliotta J.,
Furtak T. E.
Publication year - 1989
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740140112
Subject(s) - monolayer , second harmonic generation , epitaxy , thallium , polarization (electrochemistry) , metal , lattice constant , lattice (music) , materials science , analytical chemistry (journal) , electrochemistry , chemistry , condensed matter physics , inorganic chemistry , optics , electrode , nanotechnology , physics , diffraction , metallurgy , laser , layer (electronics) , chromatography , acoustics
The optical polarization properties of second‐harmonic generation at normal incidence have been used to characterize the symmetry of electrodeposited monolayers of zinc and thallium on Ag(111) while the sample was under electrochemical control. Our technique involves a non‐conventional‐wave method with standard weak optical signal detection. The overlayers exhibit a strongly bound monolayer phase that can be experimentally separated from the multilayer growth condition. Both metals grow with a C 3v symmetry that is aligned with the substrate at low coverage. This is maintained for higher coverages in the case of Tl but changes for Zn. These results are consistent with an epitaxial 8.6% expanded hexagonal monolayer for Zn, followed by a return to the Zn lattice constant at higher coverage. However, we propose that Tl grows with a coincidence lattice that is (6 × 6)–25 Tl for all coverages studied in this experiment (up to five layers).