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Lattice and grain boundary diffusion of oxygen in titanium subhydride studied by Auger sputter profiling
Author(s) -
Wittberg T. N.,
Wolf J. Douglas,
Keil R. Gerald,
Wang Pu Sen
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740130408
Subject(s) - auger electron spectroscopy , titanium , analytical chemistry (journal) , thermal diffusivity , materials science , grain boundary , oxygen , x ray photoelectron spectroscopy , spectroscopy , grain boundary diffusion coefficient , sputtering , electron energy loss spectroscopy , metallurgy , chemistry , thin film , transmission electron microscopy , nuclear magnetic resonance , microstructure , nanotechnology , thermodynamics , physics , organic chemistry , chromatography , quantum mechanics , nuclear physics
Abstract Anodic TiO 2 films were grown on titanium subhydride samples under galvanostatic conditions. The samples were heat treated at temperatures between 550 and 600°C and changes in the profile of oxygen concentration as a function of depth were monitored using Auger electron spectroscopy (AES). For TiH 0.87 and TiH 0.96 at 600°C, the lattice oxygen diffusivity, D 1 is ∼5 × 10 −15 cm 2 s −1 and the grain boundary oxygen diffusivity, D b , is given by δ D b ∼3 × 10 −18 cm 3 s −1 where δ is the grain boundary width in centimeters. Using electron energy loss spectroscopy (EELS) to measure the bulk plasmon loss energy it was possible to determine the stoichiometry of the titanium subhydride substrate. Samples of TiH 0.87 foil were found to dehydride somewhat upon heating to 600°C.