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EXAFS study of passive films on Ni and NiMo alloy electrodes
Author(s) -
Bosio L.,
Cortès R.,
Delichère P.,
Froment M.,
Joiret S.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740120703
Subject(s) - specular reflection , molybdenum , nickel , extended x ray absorption fine structure , electrode , alloy , materials science , layer (electronics) , absorption (acoustics) , surface extended x ray absorption fine structure , analytical chemistry (journal) , optics , metallurgy , chemistry , absorption spectroscopy , composite material , physics , chromatography
The specular reflectivity of x‐rays at sufficiently small grazing angles is absorption‐coefficient‐dependent so that the EXAFS technique can be used to probe the surface. This method allows in situ measurements. Applications to the study of passive films on nickel and nickel‐molybdenum alloy electrodes are presented. In both cases, the passive films is found to be composed of NiO entities probably ordered perpendicularly to the electrode. Molybdenum enrichment in the surface layer is confirmed by an increase of the Mo k edge signal.