Premium
Surface analysis of thin carbon films used as supports for electron microscopy
Author(s) -
Schlögl R.,
Tesche B.,
Weinberg G.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740120612
Subject(s) - planck , physics , astrophysics