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Electron optical methods for microanalysis of surfaces
Author(s) -
Seiler H.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740120116
Subject(s) - electron probe microanalysis , citation , library science , physics , information retrieval , analytical chemistry (journal) , computer science , chemistry , optics , scanning electron microscope , chromatography