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High spatial resolution analytical electron microscopy studies on the Co/CeO 2 system
Author(s) -
Colliex C.,
Ugarte D.,
Wang Z. L.,
Gasgnier M.,
PaulBoncour V.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740120104
Subject(s) - electron energy loss spectroscopy , spectroscopy , electron microscope , resolution (logic) , electron spectroscopy , electron , atomic units , chemistry , energy dispersive x ray spectroscopy , nanotechnology , scanning electron microscope , analytical chemistry (journal) , materials science , transmission electron microscopy , optics , physics , computer science , environmental chemistry , composite material , quantum mechanics , artificial intelligence
Anaytical electron microscopy (AEM) consists of extending the information generally delivered by the electron microscope (topography, structure) with a knowledge of the chemical and electronic properties. Its major advantage is to perform higly sensitive spectroscopies, such as electron energy loss spectroscopy (EELS), on nanovolumes of materials defined and localized within their environment. It is therfore well suited to the study of complex specimens, such as catalytical products, in which there is a competion of bulk and surface properties. Metallic Co particles on supporting CeO 2 layers provide an illustrative example of AEM capabilities. Atomic resolution images of surfaces and interfaces are associated with EELS spectroscopy and EELS maps to obtain a detailed view of the local arrangement of the different components, at successive steps of the chemical reaction. Nevertheless, beaminduced chemical tranformations of the system have been observed at the atomic scale. Radiation damage therefore constitutes the final limitation.