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XPS and IR (ATR) analysis of Pd oxide films obtained by electrochemical methods
Author(s) -
Tura Josep M.,
Regull Pere,
Victori Lluís,
de Castellar M. Dolors
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740110807
Subject(s) - x ray photoelectron spectroscopy , oxide , palladium , electrochemistry , metal , analytical chemistry (journal) , attenuated total reflection , electrode , chemistry , materials science , inorganic chemistry , infrared spectroscopy , catalysis , chemical engineering , metallurgy , biochemistry , chromatography , organic chemistry , engineering
Palladium oxide was detected by XPS and IR (Attenuated Total Reflection) analysis of the surface of a Pd electrode which was polarized in the medium 1 M KOH. This oxide set a peak of Pd 3d 5/2 shifted 3.5 eV with respect to the metal which is a much higher value than those reported and obtained for PdO and PdO 2 . An IR absorption band of 535 cm −1 was found to be different from those reported in the literature of PdO and PdO 2 . The presence of this oxide is in agreement with results obtained using electrochemical methods where the existence of PdO 3 has been assumed.
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