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Application of elastic peak electron spectroscopy (EPES) to determine inelastic mean free paths (IMFP) of electrons in copper and silver
Author(s) -
Doliński W.,
Nowicki H.,
Mróz S.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740110503
Subject(s) - inelastic mean free path , mean free path , inelastic scattering , analyser , electron , atomic physics , chemistry , copper , spectroscopy , elastic scattering , electron spectroscopy , scattering , physics , optics , nuclear physics , organic chemistry , chromatography , quantum mechanics
Elastic peak electron spectroscopy (EPES) is used for determination of inelastic mean free paths in silver and copper for electrons with energy of 250, 500, 1000 and 1500 eV. Namely, the elastic scattering coefficient η e is measured with a retarding field analyser (LEED optics) and calculated by computer simulation for different values of the inelastic mean free path λ. A value of λ giving the best fit for the measured and calculated η e is taken as the experimental inelastic mean free path. Results obtained are in agreement with those known from the literature. Equivalency between the values of η e obtained by analytic calculation and by computer simulation is found.