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From SEXAFS to SEELFS
Author(s) -
Woodruff D. P.
Publication year - 1988
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740110103
Subject(s) - surface (topology) , electron , surface extended x ray absorption fine structure , ionization , surface structure , absorption (acoustics) , atomic physics , computational physics , materials science , chemistry , extended x ray absorption fine structure , physics , molecular physics , optics , mathematics , absorption spectroscopy , quantum mechanics , ion , geometry
Surface extended x‐ray absorption fine structure (SEXAFS) is now becoming an established method of surface structural analysis. The basic method is described and examples of its application are given with particular emphasis on the potential of the method to investigate structural problems in applied surface science. Developments in the application of the same physical effects in electron ionization are reviewed, particularly in surface electron energy loss fine structure (SEELFS), and some of the relative merits of the methods, at their present states of development, are discussed.