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XPS study of reduction effects in Nb‐doped PZT ceramics
Author(s) -
Rajopadhye N. R.,
Bhoraskar S. V.,
Badrinarayan S.
Publication year - 1987
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740100804
Subject(s) - valency , x ray photoelectron spectroscopy , materials science , ceramic , niobium , hydrogen , electrical resistivity and conductivity , impurity , doping , analytical chemistry (journal) , lead zirconate titanate , oxide , conductivity , metal , chemistry , metallurgy , chemical engineering , ferroelectricity , dielectric , philosophy , linguistics , electrical engineering , optoelectronics , organic chemistry , chromatography , engineering
Electrical conductivity in lead zirconate titanate ceramic containing niobium oxide as impurity showed a marked increase when it was reduced in hydrogen atmosphere. X‐ray photoelectron spectra were used to investigate the chemical behaviour of the reduction products. Depth profiling for reduced Nb‐doped PZT indicated the presence of metallic Pb, whereas Zr, Ti and Nb did not exhibit any change in the valency. The amount of PbO showed a marked increase on the surface compared to that of inner layers in the samples. On the basis of the observed results the increase in the electrical conductivity is correlated to the oxygen vacancies produced because of the reduction in hydrogen.