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Springer series in chemical physics 44: Secondary ion mass spectrometry, SIMS V. A. Benninghoven, R. J. Colton, D. S. Simons and H. W. Werner (Editors). Springer, 1986, 561 pages
Author(s) -
Briggs D.
Publication year - 1987
Publication title -
surface and interface analysis
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740100512
Subject(s) - secondary ion mass spectrometry , citation , physics , library science , engineering physics , chemistry , mass spectrometry , computer science , quantum mechanics
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