Premium
Ellipsometry in the visible and in the infrared as a surface science technique (invited)
Author(s) -
Bermudez Victor M.
Publication year - 1987
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740100223
Subject(s) - computer science , ellipsometry , citation , library science , nanotechnology , materials science , thin film