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American Society for Testing and Materials standard practice for describing and specifying the properties of electrostatic electron spectrometers (E1016—84)
Publication year - 1987
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740100111
Subject(s) - spectrometer , electron , mathematics , physics , nuclear physics , optics
This standard is issued under the fixed designation E 1016; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon (ε) indicates and editorial change since the last revision or reapproval.

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