Premium
The use of SIMS with a microfocused ion beam to study thick corrosion scales
Author(s) -
Baker A. T.,
Bennett M. J.,
Brown A.,
Lees D. G.,
Meadowcroft D. B.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090612
Subject(s) - library science , chemistry , computer science