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Ion beam analysis of electroless thin layers deposits used for Ohmic contacts onto GaAs
Author(s) -
Lamouche D.,
Clechet P.,
Martin J. R.,
Person P.,
Chevarier A.,
Chevarier N.,
Stern M.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090529
Subject(s) - humanities , physics , art
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