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An AES study of the electron‐induced dissociation of SiO 2
Author(s) -
Juliet P.,
Blanchard B.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090515
Subject(s) - dissociation (chemistry) , physics , chemistry