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AES, SEM and EDX study of diffusion phenomena in reed switches
Author(s) -
Berghe R. Vanden,
Vlaeminck R.,
Saille M.,
Van Paemel R.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090514
Subject(s) - telecommunications , management , computer science , economics
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