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The characterization of heterogeneous catalysts by quantitative XPS
Author(s) -
Kuipers H. P. C. E.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090422
Subject(s) - x ray photoelectron spectroscopy , shell (structure) , characterization (materials science) , computer science , chemistry , library science , physics , materials science , nanotechnology , engineering , mechanical engineering , nuclear magnetic resonance
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