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Characterization of supported bimetallic FeIr/SiO 2 catalysts by mössbauer spectroscopy, temperature‐programmed reduction and X‐ray photoelectron spectroscopy
Author(s) -
Niemantsverdriet J. W.,
van der Kraan A. M.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090405
Subject(s) - bimetallic strip , x ray photoelectron spectroscopy , catalysis , mössbauer spectroscopy , temperature programmed reduction , iridium , metal , oxide , iron oxide , materials science , spectroscopy , analytical chemistry (journal) , chemistry , inorganic chemistry , chemical engineering , crystallography , metallurgy , organic chemistry , physics , quantum mechanics , engineering
Supported bimetallic FeIr/SiO 2 catalyst have been chacterized by in situ Mössbauer spectroscopy, temperature‐programmed reduction (TPR) and XPS. The reduction of iron in freshly prepared FeIr/SiO 2 catalysts is greatly facilitated by the noble metal iridium. Reduced catalysts consist of Ir‐rich fcc FeIr alloys, possibly some isolated Ir metal, and significant amounts of iron (III) oxide. The Mössbauer parameters of the latter change when the catalyst is exposed to CO gas at room temperature, indicating that the iron (III) oxide is present in a highly dispersed phase. Evacuation of reduced samples at 475 or at 775 K leads to significant oxidation of the iron in the catalyst, most likely by OH groups on the SiO 2 support.