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Electromigration and charging effects during auger and xps analysis of insulators
Author(s) -
Cazaux J.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740090213
Subject(s) - auger , x ray photoelectron spectroscopy , engineering physics , materials science , analytical chemistry (journal) , atomic physics , physics , chemistry , nuclear magnetic resonance , chromatography
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