The characterization of heterogeneous catalysts by XPS based on geometrical probability 1: Monometallic catalysts | Zendy

Kuipers H. P. C. E. | Zendy; Van Leuven H. C. E. | Zendy; Visser W. M. | Zendy

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The characterization of heterogeneous catalysts by XPS based on geometrical probability 1: Monometallic catalysts

Author(s) -

Kuipers H. P. C. E.,

Van Leuven H. C. E.,

Visser W. M.

Publication year - 1986

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740080603

Subject(s) - x ray photoelectron spectroscopy , catalysis , characterization (materials science) , spheres , particle (ecology) , materials science , layer (electronics) , basis (linear algebra) , analytical chemistry (journal) , chemistry , mathematics , nanotechnology , physics , geometry , nuclear magnetic resonance , chromatography , organic chemistry , oceanography , astronomy , geology

Geometrical probability can be used as a basis for the quantification of XPS‐signals stemming from random samples such as, for instance, supported heterogeneous catalysts. From a study of three ideal cases, namely extended layers of constant thickness, equally sized spheres and hemispheres on a randomly oriented support, it has been established that the effects of angular and layer thickness averaging are interconnected in such a way that a general model can be derived. It has been found that signal ratios as measured by XPS for convex particles are determined by the surface/volume ratios of the supported phases, nearly independent of particle shape.

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