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Surface treatment of phlogopite particles for composite applications: XPS and DRIFT studies
Author(s) -
Matienzo L. J.,
Shah T. K.
Publication year - 1986
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740080203
Subject(s) - x ray photoelectron spectroscopy , mica , phlogopite , diffuse reflection , diffuse reflectance infrared fourier transform , fourier transform infrared spectroscopy , analytical chemistry (journal) , materials science , silane , surface (topology) , infrared , chemical composition , range (aeronautics) , mineralogy , chemistry , chemical engineering , optics , physics , composite material , chromatography , organic chemistry , geometry , mathematics , mantle (geology) , engineering , catalysis , photocatalysis , geophysics
The use of XPS and diffuse reflectance fourier transform infrared spectroscopy (DRIFT) to characterize mica surfaces modified with a sulfonylazide alkoxysilane coupling agent in the range of 0.2 to 1.0% (w/w) is discussed. XPS and DRIFT provide a description of chemical composition of the surfaces as well as quantitative analysis of the amount of silane present. Both techniques correlate linearly with the amount of surface treatment. However, DRIFT is more sensitive and faster and does not require an ultra high vaccum system.