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Surface analysis of semiconductor‐incorporated polymer systems: 2—Pt‐Nafion and Pt‐CdS‐Nafion
Author(s) -
Kakuta N.,
Bard A. J.,
Campion A.,
Fox M. A.,
Webber S. E.,
White J. M.
Publication year - 1985
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740070608
Subject(s) - nafion , x ray photoelectron spectroscopy , aqueous solution , platinum , sputtering , polymer , membrane , materials science , semiconductor , analytical chemistry (journal) , chemistry , chemical engineering , thin film , electrochemistry , catalysis , nanotechnology , composite material , electrode , organic chemistry , optoelectronics , biochemistry , engineering
Pt‐Nafion (chemically reduced and sputtered Pt) and Pt‐CdS‐Nafion membranes were studied by x‐ray photoelectron spectroscopy. The chemically deposited Pt was completely reduced to Pt 0 and was more concentrated in the surface region than in the interior. The sputtered Pt (100 Å thick) was distributed within the first several hundred Ångstoms of the Nafion, probably involving Pt migration into it, during the RF sputtering process. Changes of the Pt(4f 7/2 ) linewidth indicate interactions between CdS and Pt. The relatively high activity of the 100 Å sputtered Pt‐CdS‐Nafion membrane for the photoassisted production of H 2 in aqueous 0.1 M S 2− solution is discussed.