Surface analysis of semiconductor‐incorporated polymer systems: 2—Pt‐Nafion and Pt‐CdS‐Nafion | Zendy

Kakuta N. | Zendy; Bard A. J. | Zendy; Campion A. | Zendy; Fox M. A. | Zendy; Webber S. E. | Zendy; White J. M. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Surface analysis of semiconductor‐incorporated polymer systems: 2—Pt‐Nafion and Pt‐CdS‐Nafion

Author(s) -

Kakuta N.,

Bard A. J.,

Campion A.,

Fox M. A.,

Webber S. E.,

White J. M.

Publication year - 1985

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740070608

Subject(s) - nafion , x ray photoelectron spectroscopy , aqueous solution , platinum , sputtering , polymer , membrane , materials science , semiconductor , analytical chemistry (journal) , chemistry , chemical engineering , thin film , electrochemistry , catalysis , nanotechnology , composite material , electrode , organic chemistry , optoelectronics , biochemistry , engineering

Pt‐Nafion (chemically reduced and sputtered Pt) and Pt‐CdS‐Nafion membranes were studied by x‐ray photoelectron spectroscopy. The chemically deposited Pt was completely reduced to Pt 0 and was more concentrated in the surface region than in the interior. The sputtered Pt (100 Å thick) was distributed within the first several hundred Ångstoms of the Nafion, probably involving Pt migration into it, during the RF sputtering process. Changes of the Pt(4f 7/2 ) linewidth indicate interactions between CdS and Pt. The relatively high activity of the 100 Å sputtered Pt‐CdS‐Nafion membrane for the photoassisted production of H 2 in aqueous 0.1 M S 2− solution is discussed.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research