Signal‐to‐noise measurement in X‐ray photoelectron spectroscopy | Zendy

Koenig M. F. | Zendy; Grant J. T. | Zendy

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Signal‐to‐noise measurement in X‐ray photoelectron spectroscopy

Author(s) -

Koenig M. F.,

Grant J. T.

Publication year - 1985

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740070504

Subject(s) - x ray photoelectron spectroscopy , monochromatic color , signal (programming language) , noise (video) , signal to noise ratio (imaging) , range (aeronautics) , physics , analytical chemistry (journal) , optics , materials science , nuclear magnetic resonance , chemistry , computer science , composite material , chromatography , artificial intelligence , image (mathematics) , programming language

A study of signal‐to‐noise ( S / N ) was made in a Kratos ES300 XPS system on a variety of materials using both monochromatic and conventional X‐ray sources covering a wide range of count rates. Equations relating S / N to total counts ( S + B ), background ( B ), and the signal‐to‐background ( S / B ) ratio were derived and tested for data obtained in a system limited by noise from counting statistics.

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